CoolCAD is a team of scientists and engineers that is associated with the University of Maryland and in close proximity to National Laboratories in the Washington, DC region. The key personnel of the team are internationally recognized for their contributions in semiconductor physics, especially SiC. This experience, talent pool and location give CoolCAD an opportunity to exercise its expertise in services in addition to Hardware and Software products and devices. These services include Micro-Fabrication and Design of SiC devices and circuits; Radiation effects testing of SiC electronics; Evaluation of electronics devices and circuits for operation at cryogenic temperatures.


Device and Circuit Design

Electronics Testing

A. Micro-Fabrication of SiC Based Electronics

CoolCAD will design and fabricate custom SiC devices and integrated circuits. We have a proprietary Process Design Kit (PDK) for use by our customers, which they can use to convert schematics into GDS-II files for fabrications. Fabrication services we offer include optical lithography, dry and wet etching, oxidation, annealing, chemical vapor deposition, e-beam evaporation and sputtering.

B. Design of Electronic Devices and Circuits: 

CoolCAD will design custom SiC devices and integrated circuits. We will also convert designs into chips and printed circuit boards according to customer needs. Our expert team uses the most advanced device and design tools commercially available. In addition, we have numerous in-house proprietary design software tools, such as Monte Carlo simulators, that give CoolCAD additional capabilities beyond those which are commercially available. Our design services include SiC power devices, as well as integrated circuits composed of either silicon or SiC.

C. Testing of Electronic Devices and Circuits: Cryogenics and Radiation Effects

  • Cryogenic Testing of dies- Testing of Standard Silicon Transistors at Cryogenic Temperatures (between -269oC and -196oC, 4K and 77K, using Liquid Helium; or between -196oC and 27oC, 77K and 300K, using Liquid Nitrogen) using a cryogenic probe station. CoolCAD has its own Cryogenic testing facility and equipment (TVB) for these tests, including liquified gases (Liquid nitrogen -196oC and liquid helium -296oC).
  • Cryogenic Testing of packaged devices- Testing of packaged devices at Cryogenic Temperatures (between -267oC and 27oC, 6K and 300K) using a 6K closed cycle cryostat.
  • Terrestrial neutron Radiation Testing – These tests are pursued at Los Alamos Neutron Science Center, which is the best atmospheric neutron simulator in the World. We are specialized in testing of power devices, such as silicon carbide power FETs, diodes, and silicon power IGBTs. In addition to power devices, other discretes, passives, and sensors can be tested at various ambient environments, for example, at temperatures as high as 200o
  • Heavy ion Radiation Testing – Effects of high Linear Energy (LET) heavy ions on power devices, discretes, and circuits are measured to determine survivability and degradation against this type of radiation in space. Different ions and energies are chosen to simulate worst case conditions possible for a given mission. Additionally, these tests can be performed at various temperatures, including extreme highs and lows.
  • Ionizing dose radiation testing – Performance degradation and drift due to ionizing dose radiation is measured usually using a dry Co60 source. Similar tests can also be performed using x-rays, e-beams, protons, and various other gamma cells. These tests can be performed at temperatures ranging from -196oC (77K) and 200oC (473K).

Customers for Design and Fabrication

  • NASA
  • Army Research Lab
  • Office of Naval Research
  • National Science Foundation
  • Verus Research

Customers for Radiation Cryogenic Testing : Silicon Carbide and Silicon

  • PowerAmerica
  • Cree Inc.
  • Microsemi Inc.
  • NASA
  • Tower Jazz
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